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晶體尺寸:10毫米
電學性能:半導體,拓撲絕緣體,熱電材料
晶體結構:單斜晶結構
晶胞參數:a = 1.430nm,B = 0.403nm,C = 0.986nm,α=γ= 90°,β= 95.40
晶體類型:合成
晶體純度:>99.995%
表征方法:XRD、拉曼、EDX
Powder X-ray diffraction (XRD) of a single crystal As2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal As2Te3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal As2Te3. Measurement was performed with a 785 nm Raman system at room temperature.
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